Normal view MARC view ISBD view

Core J2ee Tm Patterns Best Practices And Design

Alur Deepak

Core J2ee Tm Patterns Best Practices And Design - 2nd - Pearson Publication 2000 - 676p. Paper

ISBN:

Subjects--Topical Terms:
Computer Science

Dewey Class. No.: 001.64 / ALU

Print
Add to your cart (remove)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)